heat
Thank you Chris...
Where I have wanted to go is to Thermal. From your background, would you have in mind discrete heat signatures relative to Chemical decomposition as opposed to resistance generated heat events?
My question has to do with my perhaps faulty image of electrical resistance induced heat, and chemical, and chem/elec combinations?
Would the heat generated by internal fault be more local, and suggest the need
for multiple samples in the cell interior?
Does resistance produced by overcharging lend itself to more local sensors?
Like at the strap, or connectors?
If this technology is allowed into the future, what do you see as the difficulties in monitoring for these internal problems?
very curious....Thank you for your patience, and time.