Safeware
IEC 61508 relates to functional safety of electrical/electronic programmable safety related systems, not mechanical failures.
Outside of this well defined area a common classification used during chip manufacturing is: Random particle defects (which are usually called extra/missing material random defects or short/open random defects), happen because of contamination. Systematic defects are conditioned by the specifics of the design layout or the equipment. Def Stan 00-41 covers environmental and usage testing methods that shake this down further.
An error in manufacture or design is legally defined as a defect not a fault, that's why the F760 et al became narrative fault reporting instead of defect reporting as it was up to the 80s. There was a legal construct to do with this (cannot remember the details) but I believe the MOD lost on a technicality because it used incorrect terminology. Unfortunatley, we have still not got industry wide consensus.
Perhaps we should go offline before everyone else loses the will to live.
Holiday was top, but my french is still crap.
Regards
Retard